Brian C. Lee, Daniel Jacob Tward, Zhiyi Hu, Alain Trouvé, Michael I. Miller. Infinitesimal Drift Diffeomorphometry Models for Population Shape Analysis. In 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2020, Seattle, WA, USA, June 14-19, 2020. pages 3766-3775, IEEE, 2020. [doi]
Abstract is missing.