Kuen-Jong Lee, Pin-Hao Tang, Michael A. Kochte. An on-chip self-test architecture with test patterns recorded in scan chains. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-10, IEEE, 2016. [doi]
@inproceedings{LeeTK16-2,
title = {An on-chip self-test architecture with test patterns recorded in scan chains},
author = {Kuen-Jong Lee and Pin-Hao Tang and Michael A. Kochte},
year = {2016},
doi = {10.1109/TEST.2016.7805865},
url = {http://dx.doi.org/10.1109/TEST.2016.7805865},
researchr = {https://researchr.org/publication/LeeTK16-2},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016},
publisher = {IEEE},
isbn = {978-1-4673-8773-6},
}