Power Reduction during Scan Testing Based on Multiple Capture Technique

Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin. Power Reduction during Scan Testing Based on Multiple Capture Technique. IEICE Transactions, 91-C(5):798-805, 2008. [doi]

Authors

Lung-Jen Lee

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Wang-Dauh Tseng

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Rung-Bin Lin

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