Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin. Power Reduction during Scan Testing Based on Multiple Capture Technique. IEICE Transactions, 91-C(5):798-805, 2008. [doi]
@article{LeeTL08,
title = {Power Reduction during Scan Testing Based on Multiple Capture Technique},
author = {Lung-Jen Lee and Wang-Dauh Tseng and Rung-Bin Lin},
year = {2008},
doi = {10.1093/ietele/e91-c.5.798},
url = {http://dx.doi.org/10.1093/ietele/e91-c.5.798},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/LeeTL08},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {91-C},
number = {5},
pages = {798-805},
}