Jian-Hsing Lee, Kunihiko Takahashi, Manjunatha Prabhu, Mahadeva Iyer Natarajan. Printed-circuit board (PCB) charge induced product yield-loss during the final test. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 2, IEEE, 2015. [doi]
Abstract is missing.