Securing Scan Design Using Lock and Key Technique - researchr publication authors

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Jeremy Lee, Mohammad Tehranipoor, Chintan Patel, Jim Plusquellic. Securing Scan Design Using Lock and Key Technique. In 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. pages 51-62, IEEE Computer Society, 2005. [doi]

This author has not been identified. Look up 'Jeremy Lee' in GoogleThis author has not been identified. Look up 'Mohammad Tehranipoor' in GoogleThis author has not been identified. Look up 'Chintan Patel' in GoogleThis author has not been identified. Look up 'Jim Plusquellic' in Google

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