Jeremy Lee, Mohammad Tehranipoor, Chintan Patel, Jim Plusquellic. Securing Scan Design Using Lock and Key Technique. In 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. pages 51-62, IEEE Computer Society, 2005. [doi]
Abstract is missing.