Enhancing Test Compression With Dependency Analysis for Multiple Expansion Ratios

Taehee Lee, Nur A. Touba, Joon-Sung Yang. Enhancing Test Compression With Dependency Analysis for Multiple Expansion Ratios. IEEE Trans. on CAD of Integrated Circuits and Systems, 36(9):1571-1579, 2017. [doi]

Authors

Taehee Lee

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Nur A. Touba

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Joon-Sung Yang

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