Efficient post-configuration testing of an asynchronous nanowire crossbar system for reliability

J. S. Lee, S. Venkateswaran, M. Choi. Efficient post-configuration testing of an asynchronous nanowire crossbar system for reliability. IET Computers & Digital Techniques, 6(4):214-222, 2012. [doi]

Authors

J. S. Lee

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S. Venkateswaran

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M. Choi

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