Efficient post-configuration testing of an asynchronous nanowire crossbar system for reliability

J. S. Lee, S. Venkateswaran, M. Choi. Efficient post-configuration testing of an asynchronous nanowire crossbar system for reliability. IET Computers & Digital Techniques, 6(4):214-222, 2012. [doi]

@article{LeeVC12,
  title = {Efficient post-configuration testing of an asynchronous nanowire crossbar system for reliability},
  author = {J. S. Lee and S. Venkateswaran and M. Choi},
  year = {2012},
  doi = {10.1049/iet-cdt.2011.0025},
  url = {http://doi.ieeecomputersociety.org/10.1049/iet-cdt.2011.0025},
  researchr = {https://researchr.org/publication/LeeVC12},
  cites = {0},
  citedby = {0},
  journal = {IET Computers & Digital Techniques},
  volume = {6},
  number = {4},
  pages = {214-222},
}