Leonard Lee, Sean Wu, Charles H.-P. Wen, Li-C. Wang. On Generating Tests to Cover Diverse Worst-Case Timing Corners. In 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. pages 415-426, IEEE Computer Society, 2005. [doi]
@inproceedings{LeeWWW05,
title = {On Generating Tests to Cover Diverse Worst-Case Timing Corners},
author = {Leonard Lee and Sean Wu and Charles H.-P. Wen and Li-C. Wang},
year = {2005},
doi = {10.1109/DFTVS.2005.50},
url = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2005.50},
tags = {testing, C++},
researchr = {https://researchr.org/publication/LeeWWW05},
cites = {0},
citedby = {0},
pages = {415-426},
booktitle = {20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2464-8},
}