Seo-Seok Lee, Joon-Sung Yang. Value-aware Parity Insertion ECC for Fault-tolerant Deep Neural Network. In Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu, editors, 2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022. pages 724-729, IEEE, 2022. [doi]
@inproceedings{LeeY22-5,
title = {Value-aware Parity Insertion ECC for Fault-tolerant Deep Neural Network},
author = {Seo-Seok Lee and Joon-Sung Yang},
year = {2022},
doi = {10.23919/DATE54114.2022.9774543},
url = {https://doi.org/10.23919/DATE54114.2022.9774543},
researchr = {https://researchr.org/publication/LeeY22-5},
cites = {0},
citedby = {0},
pages = {724-729},
booktitle = {2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022},
editor = {Cristiana Bolchini and Ingrid Verbauwhede and Ioana Vatajelu},
publisher = {IEEE},
isbn = {978-3-9819263-6-1},
}