Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
In Kyung Lee, Se Re Na Yun, Kyosun Kim, Chong-Gun Yu, Jong-Tae Park. New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors. Microelectronics Reliability, 46(9-11):1864-1867, 2006. [doi]
Abstract is missing.