Channel-dependent GMM and Multi-class Logistic Regression models for language recognition

David A. van Leeuwen, Niko Brummer. Channel-dependent GMM and Multi-class Logistic Regression models for language recognition. In Odyssey 2006, The Speaker and Language Recognition Workshop, San Juan, Puerto Rico, 28-30 June 2006. pages 1-8, IEEE, 2006. [doi]

Authors

David A. van Leeuwen

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Niko Brummer

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