David A. van Leeuwen, Niko Brummer. Channel-dependent GMM and Multi-class Logistic Regression models for language recognition. In Odyssey 2006, The Speaker and Language Recognition Workshop, San Juan, Puerto Rico, 28-30 June 2006. pages 1-8, IEEE, 2006. [doi]
@inproceedings{LeeuwenB06,
title = {Channel-dependent GMM and Multi-class Logistic Regression models for language recognition},
author = {David A. van Leeuwen and Niko Brummer},
year = {2006},
doi = {10.1109/ODYSSEY.2006.248094},
url = {https://doi.org/10.1109/ODYSSEY.2006.248094},
researchr = {https://researchr.org/publication/LeeuwenB06},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {Odyssey 2006, The Speaker and Language Recognition Workshop, San Juan, Puerto Rico, 28-30 June 2006},
publisher = {IEEE},
}