Thomas Martin Lehmann, Jörg Bredno, Klaus Spitzer. Texture-Adaptive Active Contour Models. In Sameer Singh, Nabeel A. Murshed, Walter G. Kropatsch, editors, Advances in Pattern Recognition - ICAPR 2001, Second International Conference Rio de Janeiro, Brazil, March 11-14, 2001, Proceedings. Volume 2013 of Lecture Notes in Computer Science, pages 387-396, Springer, 2001. [doi]
Abstract is missing.