Jan Lehr, Alik Sargsyan, Martin Pape, Jan Philipps, Jörg Krüger. Automated Optical Inspection Using Anomaly Detection and Unsupervised Defect Clustering. In 25th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2020, Vienna, Austria, September 8-11, 2020. pages 1235-1238, IEEE, 2020. [doi]
Abstract is missing.