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IPOG/IPOG-D: efficient test generation for multi-way combinatorial testing

Yu Lei, Raghu Kacker, D. Richard Kuhn, Vadim Okun, James Lawrence. IPOG/IPOG-D: efficient test generation for multi-way combinatorial testing. Softw. Test., Verif. Reliab., 18(3):125-148, 2008. [doi]

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Yu Lei

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Raghu Kacker

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D. Richard Kuhn

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Vadim Okun

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James Lawrence

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