Yu Lei, Raghu Kacker, D. Richard Kuhn, Vadim Okun, James Lawrence. IPOG/IPOG-D: efficient test generation for multi-way combinatorial testing. Softw. Test., Verif. Reliab., 18(3):125-148, 2008. [doi]
@article{LeiKKOL08,
title = {IPOG/IPOG-D: efficient test generation for multi-way combinatorial testing},
author = {Yu Lei and Raghu Kacker and D. Richard Kuhn and Vadim Okun and James Lawrence},
year = {2008},
doi = {10.1002/stvr.381},
url = {http://dx.doi.org/10.1002/stvr.381},
tags = {testing},
researchr = {https://researchr.org/publication/LeiKKOL08},
cites = {0},
citedby = {0},
journal = {Softw. Test., Verif. Reliab.},
volume = {18},
number = {3},
pages = {125-148},
}