A Novel Adaptive Convolution Confidence Learning for Surface Defect Detection

Lei Lei, Han-Xiong Li. A Novel Adaptive Convolution Confidence Learning for Surface Defect Detection. In IEEE International Conference on Systems, Man, and Cybernetics, SMC 2023, Honolulu, Oahu, HI, USA, October 1-4, 2023. pages 171-176, IEEE, 2023. [doi]

Abstract

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