A low cost test pattern generator for test-per-clock BIST scheme

ShaoChong Lei, Zhen Wang, Zeye Liu, Feng Liang. A low cost test pattern generator for test-per-clock BIST scheme. IEICE Electronic Express, 7(10):672-677, 2010. [doi]

Authors

ShaoChong Lei

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Zhen Wang

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Zeye Liu

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Feng Liang

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