Cross-Project Software Defect Prediction Based on Feature Selection and Transfer Learning - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Tianwei Lei, Jingfeng Xue, Weijie Han. Cross-Project Software Defect Prediction Based on Feature Selection and Transfer Learning. In Xiaofeng Chen 0001, Hongyang Yan, Qiben Yan, Xiangliang Zhang 0001, editors, Machine Learning for Cyber Security - Third International Conference, ML4CS 2020, Guangzhou, China, October 8-10, 2020, Proceedings, Part III. Volume 12488 of Lecture Notes in Computer Science, pages 363-371, Springer, 2020. [doi]

This author has not been identified. Look up 'Tianwei Lei' in GoogleThis author has not been identified. Look up 'Jingfeng Xue' in GoogleThis author has not been identified. Look up 'Weijie Han' in Google

runs on WebDSL