Tianwei Lei, Jingfeng Xue, Weijie Han. Cross-Project Software Defect Prediction Based on Feature Selection and Transfer Learning. In Xiaofeng Chen 0001, Hongyang Yan, Qiben Yan, Xiangliang Zhang 0001, editors, Machine Learning for Cyber Security - Third International Conference, ML4CS 2020, Guangzhou, China, October 8-10, 2020, Proceedings, Part III. Volume 12488 of Lecture Notes in Computer Science, pages 363-371, Springer, 2020. [doi]
Abstract is missing.