Frédéric B. Leloup, Ward De Ketelaere, Jan Audenaert, Peter Hanselaer. Rapid determination of the photometric bidirectional scatter distribution function by use of a near-field goniophotometer. In Maria V. Ortiz Segovia, Philipp Urban, Jan P. Allebach, editors, Measuring, Modeling, and Reproducing Material Appearance 2014, San Francisco, California, USA, February 2-6, 2014. Volume 9018 of SPIE Proceedings, pages 901803, SPIE, 2014. [doi]
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