Joint prototype and metric learning for set-to-set matching: Application to biometrics

Mengjun Leng, Panagiotis Moutafis, Ioannis A. Kakadiaris. Joint prototype and metric learning for set-to-set matching: Application to biometrics. In IEEE 7th International Conference on Biometrics Theory, Applications and Systems, BTAS 2015, Arlington, VA, USA, September 8-11, 2015. pages 1-8, IEEE, 2015. [doi]

Abstract

Abstract is missing.