Javier Leon, Xavier Perpiñà, Viorel Banu, Josep Montserrat, Maxime Berthou, Miquel Vellvehí, Philippe Godignon, Xavier Jordà. Temperature effects on the ruggedness of SiC Schottky diodes under surge current. Microelectronics Reliability, 54(9-10):2207-2212, 2014. [doi]
Abstract is missing.