P. S. Letizia, Gabriella Crotti, Domenico Giordano, Antonio Delle Femine, Daniele Gallo, Carmine Landi, Mario Luiso. Low Cost Procedure for Frequency Characterization of Voltage Instrument Transformers. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2019, Auckland, New Zealand, May 20-23, 2019. pages 1-6, IEEE, 2019. [doi]
Abstract is missing.