Régis Leveugle, Paolo Maistri, Pierre Vanhauwaert, F. Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Athanasios Papadimitriou, David Hély, Vincent Beroulle, G. Hubert, S. De Castro, Jean-Max Dutertre, Alexandre Sarafianos, Noemie Boher, Mathieu Lisart, Joel Damiens, Philippe Candelier, C. Tavernier. Laser-induced fault effects in security-dedicated circuits. In Lorena Garcia, editor, 22nd International Conference on Very Large Scale Integration, VLSI-SoC, Playa del Carmen, Mexico, October 6-8, 2014. pages 1-6, IEEE, 2014. [doi]
@inproceedings{LeveugleMVLNFRPHBHCDSBLDCT14,
title = {Laser-induced fault effects in security-dedicated circuits},
author = {Régis Leveugle and Paolo Maistri and Pierre Vanhauwaert and F. Lu and Giorgio Di Natale and Marie-Lise Flottes and Bruno Rouzeyre and Athanasios Papadimitriou and David Hély and Vincent Beroulle and G. Hubert and S. De Castro and Jean-Max Dutertre and Alexandre Sarafianos and Noemie Boher and Mathieu Lisart and Joel Damiens and Philippe Candelier and C. Tavernier},
year = {2014},
doi = {10.1109/VLSI-SoC.2014.7004184},
url = {http://dx.doi.org/10.1109/VLSI-SoC.2014.7004184},
researchr = {https://researchr.org/publication/LeveugleMVLNFRPHBHCDSBLDCT14},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {22nd International Conference on Very Large Scale Integration, VLSI-SoC, Playa del Carmen, Mexico, October 6-8, 2014},
editor = {Lorena Garcia},
publisher = {IEEE},
isbn = {978-1-4799-6016-3},
}