Mathieu Lisart - researchr alias

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Viewing Publication 1 - 20 from 20

2021

Modeling and Simulating Electromagnetic Fault InjectionMathieu Dumont, Mathieu Lisart, Philippe Maurine. tcad, 40(4):680-693, 2021. [doi]

2019

Electromagnetic Fault Injection : How Faults OccurMathieu Dumont, Mathieu Lisart, Philippe Maurine. fdtc 2019: 9-16 [doi]

2015

Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulationNicolas Borrel, Clement Champeix, Mathieu Lisart, Alexandre Sarafianos, Edith Kussener, Wenceslas Rahajandraibe, Jean-Max Dutertre. irps 2015: 1 [doi]

Influence of triple-well technology on laser fault injection and laser sensor efficiencyNicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Alexandre Sarafianos, Jean-Max Dutertre. dft 2015: 85-90 [doi]

Electrical model of an inverter body-biased structure in triple-well technology under pulsed photoelectric laser stimulationNicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Jean-Max Dutertre, Alexandre Sarafianos. mr, 55(9-10):1592-1599, 2015. [doi]

Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currentsClement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos. iolts 2015: 150-155 [doi]

SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technologyClement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos. dft 2015: 177-182 [doi]

2014

Laser attacks on integrated circuits: From CMOS to FD-SOIJean-Max Dutertre, Stephan De Castro, Alexandre Sarafianos, Noemie Boher, Bruno Rouzeyre, Mathieu Lisart, Joel Damiens, Philippe Candelier, Marie-Lise Flottes, Giorgio Di Natale. dtis 2014: 1-6 [doi]

Electromagnetic analysis and fault injection onto secure circuitsPaolo Maistri, Régis Leveugle, Lilian Bossuet, A. Aubert, Viktor Fischer, Bruno Robisson, Nicolas Moro, Philippe Maurine, Jean-Max Dutertre, Mathieu Lisart. vlsi 2014: 1-6 [doi]

2013

2012

Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technologyA. Sarafianos, R. Llido, Jean-Max Dutertre, O. Gagliano, V. Serradeil, Mathieu Lisart, Vincent Goubier, Assia Tria, Vincent Pouget, Dean Lewis. mr, 52(9-10):2035-2038, 2012. [doi]

2011

Local and Direct EM Injection of Power Into CMOS Integrated CircuitsFrançois Poucheret, Karim Tobich, Mathieu Lisart, Laurent Chusseau, Bruno Robisson, Philippe Maurine. fdtc 2011: 100-104 [doi]

2010

Modeling Time Domain Magnetic Emissions of ICsVictor Lomné, Philippe Maurine, Lionel Torres, Thomas Ordas, Mathieu Lisart, Jérome Toublanc. patmos 2011: 238-249 [doi]

2009

Electrical modeling of the effect of beam profile for pulsed laser fault injectionC. Godlewski, Vincent Pouget, Dean Lewis, Mathieu Lisart. mr, 49(9-11):1143-1147, 2009. [doi]

2008

Near-Field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated CircuitsThomas Ordas, Mathieu Lisart, Etienne Sicard, Philippe Maurine, Lionel Torres. patmos 2009: 229-236 [doi]

2007

Signoff power methodology for contactless smartcardsJulien Mercier, Christian Dufaza, Mathieu Lisart. islped 2007: 407-410 [doi]

2006

Methodology for Dynamic Power Verification of Contactless SmartcardsJulien Mercier, Christian Dufaza, Mathieu Lisart. patmos 2006: 280-291 [doi]

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