Vincent Pouget - researchr alias

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Viewing Publication 1 - 22 from 22

2020

2019

Assessing the Reliability of Successive Approximate Computing Algorithms under Fault InjectionGennaro Severino Rodrigues, Ádria Barros de Oliveira, Fernanda Lima Kastensmidt, Vincent Pouget, Alberto Bosio. et, 35(3):367-381, 2019. [doi]

2018

Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ionsYgor Q. Aguiar, Frederic Wrobel, J. L. Autran, P. Leroux, Frédéric Saigné, Antoine D. Touboul, Vincent Pouget. mr, 88:920-924, 2018. [doi]

Comparative Analysis of Inference Errors in a Neural Network Implemented in SRAM-Based FPGA Induced by Neutron Irradiation and Fault Injection MethodsFabio Benevenuti, Fabiano Libano, Vincent Pouget, Fernanda Lima Kastensmidt, Paolo Rech. sbcci 2018: 1-6 [doi]

Exploring the inherent fault tolerance of successive approximation algorithms under laser fault injectionGennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Vincent Pouget, Alberto Bosio. latw 2018: 1-6 [doi]

Performances VS Reliability: how to exploit Approximate Computing for Safety-Critical applicationsGennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Vincent Pouget, Alberto Bosio. iolts 2018: 291-294 [doi]

2017

Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysisVincent Pouget, S. Jonathas, R. Job, J.-R. Vaillé, Frederic Wrobel, Frédéric Saigné. mr, 76:650-654, 2017. [doi]

A calculation method to estimate single event upset cross sectionFrederic Wrobel, Antoine D. Touboul, Vincent Pouget, Luigi Dilillo, Jerome Boch, Frédéric Saigné. mr, 76:644-649, 2017. [doi]

2013

Characterization and modeling of laser-induced single-event burn-out in SiC power diodesN. Mbaye, Vincent Pouget, F. Darracq, Dean Lewis. mr, 53(9-11):1315-1319, 2013. [doi]

Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cellI. El Moukhtari, Vincent Pouget, C. Larue, F. Darracq, Dean Lewis, Philippe Perdu. mr, 53(9-11):1325-1328, 2013. [doi]

2012

2011

Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratoryR. Llido, J. Gomez, Vincent Goubier, N. Froidevaux, L. Dufayard, G. Haller, Vincent Pouget, Dean Lewis. mr, 51(9-11):1658-1661, 2011. [doi]

2009

Electrical modeling of the effect of beam profile for pulsed laser fault injectionC. Godlewski, Vincent Pouget, Dean Lewis, Mathieu Lisart. mr, 49(9-11):1143-1147, 2009. [doi]

Net integrity checking by optical localization techniquesGerald Haller, Aziz Machouat, Dean Lewis, Vincent Pouget. mr, 49(9-11):1175-1181, 2009. [doi]

2008

2007

Configuration errors analysis in SRAM-based FPGAs: Software tool and practical resultsV. Maingot, Jean Baptiste Ferron, Régis Leveugle, Vincent Pouget, Alexandre Douin. mr, 47(9-11):1836-1840, 2007. [doi]

2004

Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADCVincent Pouget, Dean Lewis, Pascal Fouillat. tim, 53(4):1227-1231, 2004. [doi]

Dynamic behavior of a chemical sensor for humidity level measurement in human breathAngie Tetelin, Vincent Pouget, Jean-Luc Lachaud, Claude Pellet. tim, 53(4):1262-1267, 2004. [doi]

2002

Dynamic Fault Injection in Integrated Circuits with a Pulsed LaserDean Lewis, Pascal Fouillat, Vincent Pouget. latw 2002: 109-113

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