Table of Contents

• A Highly Reliable Wearable Device for Fall DetectionJoão Carlos Britto Filho, Marcelo Lubaszewski. 1-7 [doi]
• Evaluating Software-based Hardening Techniques for General-Purpose Registers on a GPGPUMarcio Gonçalves, José Rodrigo Azambuja, Josie E. Rodriguez Condia, Matteo Sonza Reorda, Luca Sterpone. 1-6 [doi]
• Work-Function Fluctuation Impact on the SET Response of FinFET-based Majority VotersLeonardo H. Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis. 1-6 [doi]
• Parametric faults detection and concealment on imager with FPGA implementationGhislain Takam Tchendjou, Emmanuel Simeu. 1-6 [doi]
• Evaluating the Code Encryption Effects on Memory Fault ResilienceRiccardo Cantoro, Nikolaos I. Deligiannis, Matteo Sonza Reorda, Marcello Traiola, Emanuele Valea. 1-6 [doi]
• Resistance of the Montgomery kP Algorithm against Simple SCA: Theory and PracticeIevgen Kabin, Zoya Dyka, Marcin Aftowicz, Dan Klann, Peter Langendörfer. 1-6 [doi]
• Towards Vehicle-Level Simulator Aided Failure Mode, Effect, and Diagnostic Analysis of Automotive Power Electronics ItemsJacopo Sini, M. D'Auria, Massimo Violante. 1-6 [doi]
• Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive DefectsThiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago R. Balen. 1-6 [doi]
• MMS: A Software for Error Monitoring in Memories Protected by ECCM. F. Domingos, G. H. Castro, J. Silveira, F. Silva, M. K. D. Pereira, P. Lima. 1-6 [doi]
• Influence of sampling frequency on TID response of SAR ADCsBruno L. Costa, Carlos J. Gonzalez, Rafael Galhardo Vaz, Odair Lelis Gonçalez, Tiago R. Balen. 1-6 [doi]
• An Experimental Comparison of Fault Injection Tools for Microprocessor-based SystemsAlexander Aponte-Moreno, José Isaza-González, Alejandro Serrano-Cases, Antonio Martínez-Álvarez, Sergio Cuenca-Asensi, Felipe Restrepo-Calle. 1-6 [doi]
• Mutation Operators for Concurrent Programs in ElixirMatheus Deon Bordignon, Rodolfo Adamshuk Silva. 1-6 [doi]
• Analysis and detection of hard-to-detect full open defects in FinFET based SRAM cellsZ. Perez, Javier Mesalles, Hector Villacorta, Fabian Vargas, Víctor H. Champac. 1-6 [doi]
• Soft Error Reliability of SRAM cells during the three operation statesCleiton M. Marques, Cristina Meinhardt, Paulo F. Butzen. 1-6 [doi]
• Implementing indirect test of RF circuits without compromising test quality: a practical case studyHassan El Badawi, Florence Azaïs, S. Bernard, M. Comte, Vincent Kerzèrho, Francois Lefevre, I. Gorenflot. 1-6 [doi]
• Development and evaluation of a flexible instrumentation layer for system-level testing of radiation effectsIsrael C. Lopes, Vincent Pouget, Frederic Wrobel, Frédéric Saigné, Antoine D. Touboul, Ketil Røed. 1-6 [doi]
• Circuit Level Design Methods to Mitigate Soft ErrorsRicardo A. L. Reis, Cristina Meinhardt, Alexandra L. Zimpeck, Leonardo H. Brendler, Leonardo Moraes. 1-3 [doi]
• At Speed Testing Challenges and Solutions for 56Gbps and 112Gbps PAM4 SerDesSalem Abdennadher, Kyle Tripician, Senthil Singaravelu. 1-5 [doi]
• Run-time Hardware Reconfiguration of Functional Units to Support Mixed-Critical ApplicationsRaphael Segabinazzi Ferreira, Jörg Nolte, Fabian Vargas, Nevin George, Michael Hübner. 1-6 [doi]
• A Test Architecture and VIE to Characterize Dielectric Absorption in Small CapacitorsCarlos Bernal, Manuel Jimenez, Chris Aquino, Raul Cedres. 1-5 [doi]
• Soft error reliability predictor based on a Deep Feedforward Neural NetworkDavid Ruiz Falcó, Alejandro Serrano-Cases, Antonio Martínez-Álvarez, Sergio Cuenca-Asensi. 1-5 [doi]
• Testing Heatsink Faults in Power Transistors by means of Thermal ModelDavide Piumatti, Matteo Vincenzo Quitadamo, Matteo Sonza Reorda, Franco Fiori. 1-6 [doi]
• Optimizing RISC-V ISA Usage by Sharing Coprocessors on MPSoCPedro Lima, Caio Vieira, Jorge Reis, Alexandre Almeida, Jarbas Silveira, Roger Goerl, César A. M. Marcon. 1-5 [doi]
• Wafer-Level Die Re-Test Success Prediction Using Machine LearningHardi Selg, Maksim Jenihhin, Peeter Ellervee. 1-5 [doi]