Israel C. Lopes, Vincent Pouget, Frederic Wrobel, Frédéric Saigné, Antoine D. Touboul, Ketil Røed. Development and evaluation of a flexible instrumentation layer for system-level testing of radiation effects. In IEEE Latin-American Test Symposium, LATS 2020, Maceio, Brazil, March 30 - April 2, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.