Ricardo A. L. Reis, Cristina Meinhardt, Alexandra L. Zimpeck, Leonardo H. Brendler, Leonardo Moraes. Circuit Level Design Methods to Mitigate Soft Errors. In IEEE Latin-American Test Symposium, LATS 2020, Maceio, Brazil, March 30 - April 2, 2020. pages 1-3, IEEE, 2020. [doi]
Abstract is missing.