Characterization and modeling of laser-induced single-event burn-out in SiC power diodes

N. Mbaye, Vincent Pouget, F. Darracq, Dean Lewis. Characterization and modeling of laser-induced single-event burn-out in SiC power diodes. Microelectronics Reliability, 53(9-11):1315-1319, 2013. [doi]

Abstract

Abstract is missing.