Characterization and modeling of laser-induced single-event burn-out in SiC power diodes

N. Mbaye, Vincent Pouget, F. Darracq, Dean Lewis. Characterization and modeling of laser-induced single-event burn-out in SiC power diodes. Microelectronics Reliability, 53(9-11):1315-1319, 2013. [doi]

Authors

N. Mbaye

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Vincent Pouget

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F. Darracq

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Dean Lewis

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