N. Mbaye, Vincent Pouget, F. Darracq, Dean Lewis. Characterization and modeling of laser-induced single-event burn-out in SiC power diodes. Microelectronics Reliability, 53(9-11):1315-1319, 2013. [doi]
@article{MbayePDL13,
title = {Characterization and modeling of laser-induced single-event burn-out in SiC power diodes},
author = {N. Mbaye and Vincent Pouget and F. Darracq and Dean Lewis},
year = {2013},
doi = {10.1016/j.microrel.2013.07.113},
url = {http://dx.doi.org/10.1016/j.microrel.2013.07.113},
researchr = {https://researchr.org/publication/MbayePDL13},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {53},
number = {9-11},
pages = {1315-1319},
}