Christian Dufaza - researchr alias

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Viewing Publication 1 - 20 from 20

2019

Configurable Operational Amplifier Architectures Based on Oxide Resistive RAMsHassen Aziza, Christian Dufaza, Annie Pérez, Said Hamdioui. jcsc, 28(13), 2019. [doi]

2018

A configurable operational amplifier based on oxide resistive RAMsH. Aziza, Christian Dufaza, A. Perez. dtis 2018: 1-2 [doi]

2013

Low-noise CMOS analog-to-digital interface for MEMS resistive microphoneJamel Nebhen, Eric Savary, Wenceslas Rahajandraibe, Christian Dufaza, Stéphane Meillére, Fayrouz Haddad, Edith Kussener, Hervé Barthélemy, Jaroslaw Czarny, Andrea Walther. icecsys 2013: 445-448 [doi]

2011

A partial tree vector quantizer dynamic element matching technique for audio Δ-Σ convertersEmmanuel Hardy, Hassan Ihs, Christian Dufaza, Stéphane Meillére, Rachid Bouchakour. cicc 2011: 1-4 [doi]

2007

Signoff power methodology for contactless smartcardsJulien Mercier, Christian Dufaza, Mathieu Lisart. islped 2007: 407-410 [doi]

2006

Methodology for Dynamic Power Verification of Contactless SmartcardsJulien Mercier, Christian Dufaza, Mathieu Lisart. patmos 2006: 280-291 [doi]

2002

Test Structure for IC(VBE) Parameter Determination of Low Voltage ApplicationsW. Rahajandraibe, Christian Dufaza, Daniel Auvergne, B. Cialdella, B. Majoux, V. Chowdhury. date 2002: 316-321 [doi]

1999

Multiple Paths Sensitization of Digital Oscillation Built-In Self TestChristian Dufaza. iccd 1999: 166-174 [doi]

1998

Digital oscillation-test method for delay and stuck-at fault testing of digital circuitsKarim Arabi, Hassan Ihs, Christian Dufaza, Bozena Kaminska. itc 1998: 91-100 [doi]

Theoretical properties of LFSRs for built-in self testChristian Dufaza. integration, 25(1):17-35, 1998. [doi]

1997

Test Synthesis for DC Test and Maximal Diagnosis of Switched-Capacitor CircuitsChristian Dufaza, Hassan Ihs. vts 1997: 252-260 [doi]

On the generation of pseudo-deterministic two-patterns test sequence with LFSRsChristian Dufaza, Yervant Zorian. date 1997: 69-76 [doi]

Test synthesis for DC test of switched-capacitors circuitsHassan Ihs, Christian Dufaza. date 1997: 616 [doi]

1996

A BIST-DFT technique for DC test of analog modulesChristian Dufaza, Hassan Ihs. et, 9(1-2):117-133, 1996. [doi]

Design and experimental results of a built-in voltage sensor for mixed signal testingChristian Dufaza, Hassan Ihs, Nico Verzijp. icecsys 1996: 1206-1209 [doi]

1995

BIST hardware generator for mixed test schemeChristian Dufaza, H. Viallon, Cyril Chevalier. date 1995: 424-430 [doi]

Tolerance DC bands of CMOS operational amplifierHassan Ihs, Christian Dufaza. ats 1995: 140 [doi]

1993

LFSROM an algorithm for automatic design synthesis of hardware test pattern generatorChristian Dufaza, Cyril Chevalier, Lew Fock Chong Lew Yan Voon. vts 1993: 208-214 [doi]

1992

Quasi-Linear FSMS and their Application to the Generation of Deterministic and Pseudo-random Test VectorsLew Fock Chong Lew Yan Voon, Christian Dufaza, Christian Landrault. vlsid 1992: 350-351 [doi]

BIST linear generator based on complemented outputsLew Fock Chong Lew Yan Voon, Christian Dufaza, Christian Landrault. vts 1992: 137-142 [doi]

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