Karim Arabi - researchr alias

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Viewing Publication 1 - 40 from 40

2023

Exploring the Landscape of Natural Language Processing ResearchTim Schopf, Karim Arabi, Florian Matthes. ranlp 2023: 1034-1045 [doi]

2021

Edge Computing Trends, Design and Test Challenges - KeynoteKarim Arabi. vts 2021: [doi]

2015

Brain-inspired computingKarim Arabi. itc 2015: 7 [doi]

3D VLSI: A Scalable Integration Beyond 2DKarim Arabi, Kambiz Samadi, Yang Du. ispd 2015: 1-7 [doi]

2014

Low power design techniques in mobile processesKarim Arabi. islped 2014: 1-2 [doi]

2011

Leakage power profiling and leakage power reduction using DFT hardwareRajamani Sethuram, Karim Arabi, Mohamed H. Abu-Rahma. vts 2011: 46-51 [doi]

2010

Special session 6C: New topic mixed-signal test impact to SoC commercializationKarim Arabi. vts 2010: 212 [doi]

Power noise and its impact on production test and validation of SoC devicesKarim Arabi. vts 2010: 285 [doi]

Guest EditorialKarim Arabi. et, 26(1):5, 2010. [doi]

2008

Layout of Decoupling Capacitors in IP Blocks for 90-nm CMOSXiongfei Meng, Resve A. Saleh, Karim Arabi. tvlsi, 16(11):1581-1588, 2008. [doi]

2007

Power Supply Noise in SoCs: Metrics, Management, and MeasurementKarim Arabi, Resve A. Saleh, Xiongfei Meng. dt, 24(3):236-244, 2007. [doi]

A Novel Active Decoupling Capacitor Design in 90nm CMOSXiongfei Meng, Karim Arabi, Resve Saleh. iscas 2007: 657-660 [doi]

2006

Novel Decoupling Capacitor Designs for sub- 90nm CMOS TechnologyXiongfei Meng, Resve A. Saleh, Karim Arabi. isqed 2006: 266-271 [doi]

2004

Mixed RL-Huffman encoding for power reduction and data compression in scan testMohammad H. Tehranipour, Mehrdad Nourani, Karim Arabi, Ali Afzali-Kusha. iscas 2004: 681-684

2003

Overview of the IEEE P1500 StandardFrancisco DaSilva, Yervant Zorian, Lee Whetsel, Karim Arabi, Rohit Kapur. itc 2003: 988-997 [doi]

Mixed Signal DFT: A Concise OverviewBozena Kaminska, Karim Arabi. iccad 2003: 672-680 [doi]

2002

Mixed-Signal BIST: Fact or FictionKarim Arabi. itc 2002: 1202 [doi]

Logic BIST and Scan Test Techniques for Multiple Identical BlocksKarim Arabi. vts 2002: 60-68 [doi]

Multi-GigaHertz Testing Challenges and SolutionsKarim Arabi, Klaus-Dieter Hilliges, David C. Keezer, Sassan Tabatabaei. vts 2002: 265-268 [doi]

2001

Reducing Test Time in the High-Volume Production of Analog Circuits using Efficient Test-Vector Generation and Interpolation TechniquesMustapha Slamani, Karim Arabi. et, 17(5):417-425, 2001. [doi]

1999

Oscillation-test methodology for low-cost testing of active analog filtersKarim Arabi, Bozena Kaminska. tim, 48(4):798-806, 1999. [doi]

1998

1997

Built-In Temperature Sensors for On-line Thermal Monitoring of Microelectronic StructuresKarim Arabi, Bozena Kaminska. iccd 1997: 462-467

Design and Realization of an Accurate Built-In Current Sensor for On-Line Power Dissipation Measurement and I::DDQ:: TestingKarim Arabi, Bozena Kaminska. itc 1997: 578-586

Parametric and Catastrophic Fault Coverage of Analog Circuits in Oscillation-Test MethodologyKarim Arabi, Bozena Kaminska. vts 1997: 166-171 [doi]

Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated CircuitsKarim Arabi, Bozena Kaminska. itc 1997: 786-795

Efficient and accurate testing of analog-to-digital converters using oscillation-test methodKarim Arabi, Bozena Kaminska. date 1997: 348-352 [doi]

Testing analog and mixed-signal integrated circuits using oscillation-test methodKarim Arabi, Bozena Kaminska. tcad, 16(7):745-753, 1997. [doi]

Analog and Mixed-Signal Benchmark Circuits-First ReleaseBozena Kaminska, Karim Arabi, I. Bell, José L. Huertas, B. Kim, Adoración Rueda, Mani Soma, Prashant Goteti. itc 1997: 183-190

1996

1995

An Offset Compensated CMOS Current-Feedback Operational-AmplifierJieyan Zhu, Mohamad Sawan, Karim Arabi. iscas 1995: 1552-1555

1994

A new built-in self-test approach for digital-to-analog and analog-to-digital convertersKarim Arabi, Bozena Kaminska, Janusz Rzeszut. iccad 1994: 491-494 [doi]

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