Karim Arabi, Bozena Kaminska, Janusz Rzeszut. A new built-in self-test approach for digital-to-analog and analog-to-digital converters. In Jochen A. G. Jess, Richard L. Rudell, editors, Proceedings of the 1994 IEEE/ACM International Conference on Computer-Aided Design, 1994, San Jose, California, USA, November 6-10, 1994. pages 491-494, IEEE Computer Society, 1994. [doi]
Abstract is missing.