Sassan Tabatabaei - researchr alias

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Viewing Publication 1 - 26 from 26

2020

2Saleh Heidary Shalmany, Kamran Souri, Uaur Sonmez, Kianoush Souri, Michele D'Urbino, Said Hussaini, Darryl Tauro, Sassan Tabatabaei. isscc 2020: 70-72 [doi]

2017

A MEMS-Assisted Temperature Sensor With 20-µK Resolution, Conversion Rate of 200 S/s, and FOM of 0.04 pJK2Meisam Heidarpour Roshan, Samira Zaliasl, Kimo Joo, Kamran Souri, Rajkumar Palwai, Lijun Will Chen, Amanpreet Singh, Sudhakar Pamarti, Nicholas Miller, Joseph C. Doll, Carl Arft, Sassan Tabatabaei, Carl Sechen, Aaron Partridge, Vinod Menon. jssc, 52(1):185-197, 2017. [doi]

2016

11.1 Dual-MEMS-resonator temperature-to-digital converter with 40 K resolution and FOM of 0.12pJK2Meisam Heidarpour Roshan, Samira Zali Asl, Kimo Joo, Kamran Souri, Rajkumar Palwai, Lijun Will Chen, Sudhakar Pamarti, Joseph C. Doll, Nicholas Miller, Carl Arft, Sassan Tabatabaei, Carl Sechen, Aaron Partridge, Vinod Menon. isscc 2016: 200-201 [doi]

2013

A Temperature-to-Digital Converter for a MEMS-Based Programmable Oscillator With < ±0.5-ppm Frequency Stability and < 1-ps Integrated JitterMichael H. Perrott, James C. Salvia, Fred S. Lee, Aaron Partridge, Shouvik Mukherjee, Carl Arft, Jin Tae Kim, Niveditha Arumugam, Pavan Gupta, Sassan Tabatabaei, Sudhakar Pamarti, Haechang Lee, Fari Assaderaghi. jssc, 48(1):276-291, 2013. [doi]

2012

A temperature-to-digital converter for a MEMS-based programmable oscillator with better than ±0.5ppm frequency stabilityMichael H. Perrott, Jim Salvia, Fred S. Lee, Aaron Partridge, Shouvik Mukherjee, Carl Arft, Jin Tae Kim, Niveditha Arumugam, Pavan Gupta, Sassan Tabatabaei, Sudhakar Pamarti, Haechang Lee, Fari Assaderaghi. isscc 2012: 206-208 [doi]

2010

Silicon MEMS Oscillators for High-Speed Digital SystemsSassan Tabatabaei, Aaron Partridge. micro, 30(2):80-89, 2010. [doi]

2009

Silicon MEMS oscillators for high speed digital systemsAaron Partridge, Sassan Tabatabaei. hotchips 2009: 1-25 [doi]

2007

Design of a Tunable Differential Ring Oscillator With Short Start-Up and Switching TransientsA. K. M. K. Mollah, Roberto Rosales, Sassan Tabatabaei, James Cicalo, André Ivanov. tcas, 54-I(12):2669-2682, 2007. [doi]

2005

2004

2003

An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLsFlorence Azaïs, Yves Bertrand, Michel Renovell, André Ivanov, Sassan Tabatabaei. dt, 20(1):60-67, 2003. [doi]

Yield, Overall Test Environment Timing Accuracy, and Defect Level Trade-Offs for High-Speed Interconnect Device TestingBaosheng Wang, Yong B. Cho, Sassan Tabatabaei, André Ivanov. ats 2003: 348-353 [doi]

2002

2000

Defect Oriented Testing of an ECL/CMOS Level Converter CircuitMin-Hsing P. Chen, André Ivanov, Sassan Tabatabaei. latw 2012: 42-46

1999

A Current Integrator for BIST of Mixed-Signal ICsSassan Tabatabaei, André Ivanov. vts 1999: 311-318 [doi]

A built-in current monitor for testing analog circuit blocksSassan Tabatabaei, André Ivanov. iscas 1999: 109-114 [doi]

1998

Testing for Floating Gates Defects in CMOS CircuitsSumbal Rafiq, André Ivanov, Sassan Tabatabaei, Michel Renovell. ats 1998: 228-236 [doi]

1997

Power supply current monitoring techniques for testing PLLsManeesha Dalmia, André Ivanov, Sassan Tabatabaei. ats 1997: 366-371 [doi]

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