Jingzheng Li, Hailong Sun 0001. Correct Twice at Once: Learning to Correct Noisy Labels for Robust Deep Learning. In João Magalhães, Alberto Del Bimbo, Shin'ichi Satoh 0001, Nicu Sebe, Xavier Alameda-Pineda, Qin Jin, Vincent Oria, Laura Toni, editors, MM '22: The 30th ACM International Conference on Multimedia, Lisboa, Portugal, October 10 - 14, 2022. pages 5142-5151, ACM, 2022. [doi]
Abstract is missing.