Mike Li. Is Design to Production The Ultimate Answer For Jitter, Noise, and BER Challenges For Multi GB/s ICs?. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 1433, IEEE, 2004. [doi]
@inproceedings{Li04:39,
title = {Is Design to Production The Ultimate Answer For Jitter, Noise, and BER Challenges For Multi GB/s ICs?},
author = {Mike Li},
year = {2004},
doi = {10.1109/ITC.2004.108},
url = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.108},
tags = {design},
researchr = {https://researchr.org/publication/Li04%3A39},
cites = {0},
citedby = {0},
pages = {1433},
booktitle = {Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA},
publisher = {IEEE},
isbn = {0-7803-8581-0},
}