Yifan Li, Hu Han 0001, Shiguang Shan, Xilin Chen 0001. DISC: Learning from Noisy Labels via Dynamic Instance-Specific Selection and Correction. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023, Vancouver, BC, Canada, June 17-24, 2023. pages 24070-24079, IEEE, 2023. [doi]
Abstract is missing.