Chengpeng Li, Chenguang Zhu 0002, Wenxi Wang, August Shi. Repairing Order-Dependent Flaky Tests via Test Generation. In 44th IEEE/ACM 44th International Conference on Software Engineering, ICSE 2022, Pittsburgh, PA, USA, May 25-27, 2022. pages 1881-1892, IEEE, 2022. [doi]
Abstract is missing.