Real-time simulation of CDSM modular multilevel converter for HIL test applications

Wei Li. Real-time simulation of CDSM modular multilevel converter for HIL test applications. In IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society, Florence, Italy, October 23-26, 2016. pages 2372-2377, IEEE, 2016. [doi]

Authors

Wei Li

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