Wei Li. Real-time simulation of CDSM modular multilevel converter for HIL test applications. In IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society, Florence, Italy, October 23-26, 2016. pages 2372-2377, IEEE, 2016. [doi]
@inproceedings{Li16a-23,
title = {Real-time simulation of CDSM modular multilevel converter for HIL test applications},
author = {Wei Li},
year = {2016},
doi = {10.1109/IECON.2016.7793028},
url = {https://doi.org/10.1109/IECON.2016.7793028},
researchr = {https://researchr.org/publication/Li16a-23},
cites = {0},
citedby = {0},
pages = {2372-2377},
booktitle = {IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society, Florence, Italy, October 23-26, 2016},
publisher = {IEEE},
isbn = {978-1-5090-3474-1},
}