Jing Li, Charles Augustine, Sayeef S. Salahuddin, Kaushik Roy. Modeling of failure probability and statistical design of spin-torque transfer magnetic random access memory (STT MRAM) array for yield enhancement. In Limor Fix, editor, Proceedings of the 45th Design Automation Conference, DAC 2008, Anaheim, CA, USA, June 8-13, 2008. pages 278-283, ACM, 2008. [doi]
Abstract is missing.