Shuai Li, Xiue Bao, Giovanni Gugliandolo, Haoyun Yuan, Jinkai Li, Linxiang Shao, Minghe Du, Nicola Donato, Zlatica Marinkovic, Giovanni Crupi, Lili Fang, Liming Si, Houjun Sun. Defect Modeling During the SLM Process for Manufacturing Microwave Devices. In IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2023, Milano, Italy, October 25-27, 2023. pages 412-416, IEEE, 2023. [doi]
Abstract is missing.