Face X-Ray for More General Face Forgery Detection

Lingzhi Li, Jianmin Bao, Ting Zhang, Hao Yang, Dong Chen, Fang Wen, Baining Guo. Face X-Ray for More General Face Forgery Detection. In 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2020, Seattle, WA, USA, June 13-19, 2020. pages 5000-5009, IEEE, 2020. [doi]

Abstract

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