Test Data Compression Using Dictionaries with Fixed-Length Indices

Lei Li, Krishnendu Chakrabarty. Test Data Compression Using Dictionaries with Fixed-Length Indices. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 219-224, IEEE Computer Society, 2003. [doi]

Authors

Lei Li

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Krishnendu Chakrabarty

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